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Papers

• Charles M. Rackson,��Joseph T. Toombs, Martin P. De Beer, Caitlyn C. Cook, Maxim Shusteff,��Hayden K. Taylor,��Robert R. McLeod, "", Optics��Letters.��47, 1279-1282 (2022).
• Elliot J. Strand, Eloise Bihar, Sean M. Gleason, Sanggil Han, Samuel W. Schreiber, Megan N. Renny, George G. Malliaras, Robert R. McLeod, Gregory L. Whiting, "", Advanced Electronic Materials 2021��.
• Charles M. Rackson, Kyle M. Champley, Joseph T. Toombs, Erika J. Fong, Vishal Bansal, Hayden K. Taylor, Maxim Shusteff, Robert R. McLeod,��"", Additive Manufacturing 48, 102367 (2021).
• Shao-Tuan Chen,��Megan N. Renny,��Liliana C. Tomé,��Jorge L. Olmedo-Martínez,��Esther Udabe,��Elise P. W. Jenkins,��David Mecerreyes,��George G. Malliaras,��Robert R. McLeod,��Christopher M. Proctor, "", Advanced Science 2021��.��
• Asais Camila Uzcategui, Callie I Higgins, John E Hergert, Andrew E Tomaschke, Victor Crespo-Cuevas, Virginia L Ferguson, Stephanie J Bryant, Robert R McLeod, Jason P Killgore, "," Small Science, 2021.��
• McLeod, R.R., “,” Polymers 2020, 2744, 2020. ��DOI: 10.3390/polym12112744
• Hu, Y., Kowalski, B.A., Mavila, S., Podgórski, M., Sinha, J., ��Sullivan, A.C., ��McLeod, R.R., Bowman, C.N., ��“,” ACS Applied Materials & Interfaces 12 (39), 44103-44109, 2020. DOI: 10.1021/acsami.0c08872
• Cook, C. C., Fong, E. J., Schwartz, J. J., Porcincula, D. H., Kaczmarek, A. C., Oakdale, J. S., Moran, B. D., Champley, K. M., Rackson, C. M., Muralidharan, A., McLeod, R. R., Shusteff, M., “” Adv. Mater. 2020, 2003376, 2020. ��https://doi.org/10.1002/adma.202003376
• D. B. Miller, A. Jones, R.R. McLeod, “” Applied Optics 59 (18), 5399-5407, 2020
• C.I. Higgins, J. Killgore, F.W. DelRio, S. Bryant, R. R. McLeod, “,” Soft Matter 2020, 4131-4141, 2020���� ��
• M. D. Alim, K. K. Childress, N. J. Baugh, A. M. Martinez, A. Davenport, B. D. Fairbanks, M. K. McBride, B. T. Worrell, J. W. Stansbury, R. R. McLeod, C. N. Bowman, “,” Materials Horizons 7, 835-842, 2020.

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Proceedings

• Miller, D. B, McLeod, R. R, "", Proc. SPIE 11696, Advanced��Fabrication Technologies for Micro/Nano Optics and Photonics XIV, 116960S��(5 March 2021); doi: 10.1117/12.2578908.��
• Miller, D. B, Jones, A. M, McLeod, R. R, "Super-resolution critical dimension limits of positive tone i-line photoresists," Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI, pp. 105440N, 2018
• Uzcategui, A C., Muralidharan, A., Ferguson, V. L, Bryant, S. J, McLeod, R. R, "," Microfluidics, BioMEMS, and Medical Microsystems XVI, pp. 104910B, 2018
• Alim, M., Mavila, S., Glugla, D. J, Wang, Chen, Nystrom, P. D, Sullivan, A. C, Bowman, C. N, McLeod, R. R, "High dynamic range two-stage photopolymer materials through enhanced solubility high refractive index writing monomers," Practical Holography XXXII: Displays, Materials, and Applications, pp. 105580D, 2018

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Dissertations

• Charles Rackson,��Doctor of Philosophy in Electrical Engineering,��,��University of Colorado, 2022.
• David Miller,��Doctor of Philosophy in Electrical Engineering,��Univesity of Colorado, 2020
• Marvin Alim,��Doctor of Philosophy in Materials Science and Engineering,��, Univesity of Colorado, 2019.��
• David Glugla,��Doctor of Philosophy in Electrical Engineering,�� ,��University of Colorado, 2018.
• Jacob Friedlein,�� Doctor of Philosophy in Electrical Engineering,��,�� University of Colorado, 2017.
• Martha Bodine,�� Doctor of Philosophy in Electrical Engineering,��,��University of Colorado, 2017.
• Callie Fiedler,��,��University of Colorado, 2017.

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Patents

• McLeod, R. R; Cole, M.; "," US Patent 8,944,594 (2015)
• Moore, E.; McLeod, R.; "," US Patent 9,025,160 (2015)
• McLeod, R. R; Urness, A.; Cole, M.; Moore, E.; "" US Patent 9,034,568 (2015)

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